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Get Your Copy of MS-DOS

Test & Measurement

6 Ways Innovation is Changing Calibration

Application-Centric IIoT Gateway Enables Quick Solution Deployment

Application-Centric IIoT Gateway Speeds Solution Deployment

Top Stories of the Week: Apr. 22-26, 2024

Featured

GaN Spearheads Battery-Charging Revolution

Gallium nitride is becoming the technology of choice for charging EVs, HEVs, and other applications, bringing 3X greater speed when compared to silicon-based solutions.

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Ideas for Design Vol. 3, No. 10 (Download)

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Editor's Choice

Quick Poll: Remembering MS-DOS

Advances in IoT Security: Enhanced Crypto Standards and High-Power Processing

Machine Learning

Quick Poll: How Are You Using Generative AI and LLMs?

What Actually is a Hot Loop?

SEARCH FOR DATA SHEETS, PRICE, STOCK, AND PART STATUS OF ELECTRONIC COMPONENTS

Industry Insights

Machine Learning

Speculations on AI, Co-Evolution, and the Future of Our Species

More Product Highlights from embedded world 2024

Tesla Robotaxi Arriving in August, But Plans Dropped for Low-Cost EV

Bridging the Gap from IIoT Promise to IIoT Reality

What is the Economic Value of V2X in the U.S.?

Technology Advancements

Redefining SmartNICs: The Composable Advantage

Voltage-Regulator ICs Close the Power Gap with Next-Gen Chips

Increasing EV Powertrain Efficiency Without Rare-Earth Materials

Top Strategies to Improve Microcontroller Security (Part 2)

“Drinking Bird” Becomes Triboelectric Energy Harvester

NACS/SAE J3400 EV Charging Interface: Protocols and the Transition (Part 2)

Top Strategies to Improve Microcontroller Security (Part 1)

Tapping Secrets of Li-ion Cell Temperature to Improve Cold Performance

Products and Solutions

Gesture-Based Video Game Showcases Advanced MCU Performance

Adaptive SoC Delivers Single-Chip Automotive Solution

What Caught Our Attention at embedded world 2024? @ mwrf.com

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Learning Resources

Mid-Voltage Systems Turn to GaN Devices to Achieve the Highest Power Density

Analog

Solar Constant Lighting System Uses PV-Pushback-Effect

Voltage-Reference IC with Integral Heater Offers Single PPM-Class Results

Enhance ToF Mass Spectrometry with Low-Noise, High-Speed ADCs

Embedded

Packing CXL-Attached Memory into a PCIe Card

UMI Scales the Memory Wall in the Chiplet/Multi-Die Era

AMD’s New Family of Low-Cost FPGAs is All About Flexibility

Automation

The Robotics Revolution in Retail

Modular Industrial Raspberry Pi Delivers Flexible Customization

Machine Learning

Edge AI Unlocks a Safer World with Smarter Video Cameras

Test & Measurement

Rotary Encoder Wheels Perform Linear Position and Speed Sensing

Power

Apply Power-Density Fundamentals to Enhance Power-Management Systems

Test & Measurement

Benefits from Calibrating Your Battery Tester

Lesser-Known High-Voltage Methods: From X-rays to Offshore Wind Farms

Bidirectional Current-Sense Amp Boosts Accuracy in Automotive Apps

Dual-Phase Voltage Regulator Brings the Power to Big AI Chips

Smart Ideal Diodes Protect Car Battery Front-Ends

Communications

Inside Intel’s Gaudi 3 Chip for AI Training and Inference

Quadrifilar Helix Antenna: Simplifying Remote Communications

Electronic Design’s BBS Restarts After 30 Years During Catastrophic Website Outage

Design the Heat Out of 3D Chip Technology

Test & Measurement

NVIDIA’s Omniverse Cloud APIs Redefine Digital-Twin Applications

Does This Chip Hold the Future of the Semiconductor Industry?

Test & Measurement

Dev Kit Simplifies Automotive Dynamic RGB-LED App Development

Sponsored Content

Learning Resources

Accurate, Reliable High-Voltage Sensing is Critical to the Future of Electrification

How to Build Wide-Dynamic-Range Systems (Part 2)

Test & Measurement

The Essentials for Quality TDECQ Measurements