Rohde & Schwarz will demonstrate Long-Term Evolution (LTE) frequency-division duplexing (FDD) testing capabilities based on mimoOn’s newest femtocell design at booth 6033 at the CTIA Wireless 2009 show in Las Vegas this week. The compact test setup features the R&S SMBV100A vector signal generator and the R&S FSV signal analyzer, which generate and analyze LTE signals that meet the newest specification.

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According to Rohde & Schwarz, the test setup verifies that the mimoOn femtocell reference design correctly operates according to the LTE specification, which is about to be finalized. The FSV signal analyzer and the FSV-K100 downlink analysis option accurately validated the reference design’s generated downlink signal, Rohde & Schwarz says.

The FSV’s touchscreen interface is designed to simplify testing from the reference design to the final application of enhanced Node B (eNB) and Home eNB infrastructure. The signal analyzer offers a 40-MHz analysis bandwidth as well. The SMBV100A eases the task via a graphical user interface and internal signal setup and generation. The SMBV-K55 option makes the creation of LTE uplink and downlink signals of excellent quality straightforward and convenient, according to Rohde & Schwarz.

The demonstration will be held at Rohde & Schwarz’s booth, 6033. Central Hall MR-318 will feature mimoOn’s designs for LTE.