W. L. Gore & Associates, Inc. has released 110 GHz test assemblies, the newest addition to the GORE PHASEFLEX microwave test assemblies product family. These new test assemblies, with performance through 110 GHz, offer torque and crush resistance, as well as stability with flexure and temperature, all while remaining flexible.

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The test assemblies provide phase and amplitude stability with flexure over a wide temperature range. For example, when an assembly was bent 90 degrees around a 1-inch radius mandrel, the change was only 4.3 degrees and 0.05 dB at 110 GHz. When returned to its original configuration, phase and amplitude returned to their original values. As a result, accurate and repeatable measurements are achieved without needing to repeat time-consuming calibrations between measurements. The assemblies are also flexible, with virtually no springback, allowing for easy test set-up and minimizing stresses on devices under test, probe tips, and adapters. The assemblies can be flexed, reformed, or repositioned while minimizing the chance of damaging the assembly or test components.

Internal ruggedization makes these assemblies crush- and torque-resistant, while still maintaining a small outer diameter of only 0.165-inch (nominal). Even with this small size, the assemblies are still low loss. Typical insertion loss for a 16 cm assembly at 110 GHz is 2.1 dB.