Agilent Technologies has introduced bit ratio testers (BERTs) that enable high-quality total jitter (TJ) measurements that are more than 40 times faster than is realizable with any other existing BER measurement solution. Using this new measurement enables engineers to perform high-quality device characterization while speeding the development of new products. The measurement of TT is important to ensure the proper working of high-speed devices such as PCI Express II, Serial ATA III and 8X Fibre Channel.

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The fast TJ measurement is simple to make, requiring the user to select only the desired bit error ratio and the resolution accuracy. The uncertainty of the TJ measurement is also determined, which defines the significance of the result. The Fast TJ measurement is independent of jitter modeling and works on any jitter distribution, further increasing overall confidence in the measurement.

The fast TJ measurement is included in the new firmware releases of the Agilent ParBERT 81250 measurement suite and the high-performance N4901B/02B serial BERTs. The firmware updates are free for download at www.agilent.com/find/FTJ.