State and timing modules

Agilent Technologies announces three state and timing analysis modules for the Agilent 16700 family of logic analyzers. The 16740A, 16741A and 16742A modules feature clock rates as high as 200 MHz and key features such as deep memory and fast update rates for accelerated debugging. Additional features include quick waveform draw, pan, zoom and complex searching, which provide fast insight into a system with no waiting. Deep memory is available to avoid slow responsiveness so a waveform with 16 Ms/s of memory can be redrawn in seconds. Included are simultaneous 200 MHz state acquisition and 2 GHz timing analysis, which allows users to quickly capture elusive glitches and precise timing details; Visitrigger, which makes it easier to set up complex triggers for maximum insight when troubleshooting; and transitional timing, which allows users to capture more timing information by storing only transitions. User flexibility is available from 1 Msample-, 4 Msample-, or 16 Msample-memory depth, depending on budgets.
Agilent Technologies
www.agilent.com.

4 GHz WLAN tester

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Berkeley is now shipping the Locust IEEE 802.11b wireless receiver with an internal 12-channel GPS receiver designed specifically for sweeping and optimizing 2.4 GHz DSSS LANs via drive-test analysis. New features include PEAK measurement for antenna alignment, SSID network identification, WEP privacy encryption detection and PER for details on rates of 1, 2, 5.5 and 11 Mb/s. Locust tunes all 14 channels, providing measurements in real time. It also logs data to removable 16 MB PC Flash card for further post-processing analysis using a drive-test vehicle, GPS antenna and a laptop PC.
Berkeley Varitronics
www.bvsystems.com
info@bvsystems.com

System offers higher wafer test throughput

Keithley Instruments announces the model S600DCIRF APT System, a single-insertion DCIRF parametric test solution for probing communications and high-speed digital devices at the wafer level. When used with a suitable test structure layout, the system can execute independent DC and RF tests in parallel or separate probes. The system incorporates a vector network analyzer (VNA) and DC/RF probe card technology, supports “lights out” factory automation, and is compatible with both 200 mm and 300 mm probers. It allows single DUT testing as high as 10 GHz. Moreover, RF connections embedded on the test head and per-pin electronics eliminate manual setup. The probe card loads in the same way that it does for DC operation and the system's RF capabilities can be accessed through a transparent interface. Test results can be easily imported into a variety of popular device modeling packages, such as BSIMPro, IC-CAP, and UTMOST. The system provides highly repeatable RF measurements of 2-port/4-terminal power parameters (a1, a2, b1, and b2). Its 1 kHz frequency resolution makes it easy to “dial in” the desired frequency.
Keithley Instruments
www.keithley.com
productjnfo@keithley.com