8 GHz oscilloscope

Tektronix Inc. has announced a new 8 GHz bandwidth TDS6000B Digital Storage Oscilloscope (DSO) series. The product features a signal fidelity with pinpoint triggering, four channels of concurrent high-resolution waveform capture, and a differential probing solution using IBM's 0.18 um silicon germanium (7HP SiGe) technology.

The oscilloscope series consists of the TDS6804B and TDS6604B, featuring bandwidths of 8 GHz and 6 GHz, respectively. With the TDS6804B, the user can select between 7 GHz analog bandwidth and an 8 GHz digital signal processing (DSP) enhancement. The bandwidth choice provides customers with both the analog bandwidth and magnitude and phase compensation of DSP.

Each model includes 20 GSps on all four channels and up to 32 Megasamples record concurrently on all four channels. The combination of attributes across all channels in the TDS6804B enables rise-time measurements down to 35 ps (20% to 80%) with DSP turned on and capturing 1.6 ms time windows at full sample rate.

Along with the TDS6000B, Tektronix also introduced the P7380SMA active differential probe. The probe is an active differential signal acquisition system designed specifically to bring the TDS6804B's full-bandwidth performance to the test point. This probing platform is based on the IBM's silicon-germanium (7 HP SiGe) process. This SiGe process incorporates a high-performance bipolar device optimized for high-speed or low-power applications.
Tektronix
(800) 833-9200
www.tektronix.com

Rack-mounted DAQ

The ICS daqPC (a 19-inch rack-mountable box that is 8.7 inches high) offers a platform for recording up to two 40 MHz bandwidth (flat-top) signals in real time. The internal storage is more than 1.4 TeraByte. The ICS-554 (105 MHz 14-bit ADC PMC module) can convert any IF signal frequency up to 300 MHz. Onboard Gray chip tuners or pre-configured Xilinx FPGA (for bandwidths >10 MHz) can perform programmable downconversion of IF signals of bandwidths up to 40 MHz. The recorded data can be either real or complex (I & Q).
ICS
(613) 749-9241
www.ics-ltd.com

Vector network and component analyzer

Advantest has introduced the R3860A/R3768/R3770 Vector Network and Component Analyzer. The R3860A RF component analyzer is a new-generation analyzer that can measure RF modules that combine multiple functions. The R3768/3770 network analyzer is a multiport analyzer designed with an emphasis on measuring passive components. Higher frequencies are also supported, with the R3680A/R3768 supporting frequencies from 300 kHz to 8 GHz and the R3770 supporting frequencies from 300 kHz to 20 GHz.

All models have the software fixture function that perform real-time simulation of virtual matching circuits and standardized impedance conversion in addition to S-parameter analysis. The sweep is 5 µs/points. Moreover, multiport models can perform software balun simulations and balance parameter analysis. The large, high-visibility display is a key factor in improving the analysis efficiency because it enables the simultaneous display of multiport paths in addition to the simultaneous display of fixture simulation traces.
Advantest
(408) 988-7700
www.advantest.com

Handheld spectrum analyzer

Covering the 100 kHz to 3.0 GHz frequency band, Anritsu's MS2711D handheld spectrum analyzer features a pre-amplifier (standard), a battery-operated, portable spectrum analyzer. Its performance combined with ease-of-use and broad functionality makes it suitable for field environments and applications that require mobility such as site surveys and on-site system test. It is configured with an optional built-in transmission measurement that adds scalar analysis capability from 25 MHz to 2.5 GHz. A color display can be ordered as option 3. This display is for indoor use only.

The MS2711D also features several dedicated one-button measurements that include channel power, adjacent-channel power ratio, and occupied bandwidth measurements that can confirm the distortion level or channel power level of an AMPS, TDMA, CDMA or GSM transmitter. Additionally, the analyzer can conduct a series of spurious measurements when analyzing a wireless base station transmitter, while the field strength mode allows users to measure propagation and coverage, or to pinpoint electromagnetic (EM) leakage in broadcast systems. Measurement of carrier to interference has been added. This measurement is targeted for measurements of 802.11 a, b and g access points. Other features include trace averaging for more accurate noise measurements; a multilingual user interface with on-screen menus and messaging in six languages; and a 50-Ohm interface that is adaptable to 75 Ohms, enabling users to conduct measurements of 75-Ohm systems without sacrificing measurement accuracy.

The analyzer includes data analysis software, a soft carrying case, rechargeable/field-replaceable battery, AC/DC power supply, and 12.5 V automobile cigarette lighter adapter and users guide.

Anritsu Company has also introduced the MP1590A-30, a jitter analysis option for its MP1590A Network Performance Tester. With this option, the MP1590A delivers a +/-20 mUIp-p accuracy in jitter measurement, supporting the phase analysis method recommended in the revised ITU-T Draft 0.172 (2003.11).

In addition to the +/-20 mUIp-p accuracy, the MP1590A-30 has measurement repeatability of +/-5 mUIp-p, as well as intrinsic jitter of 50 mUIp-p. The combination of high accuracy and repeatability with low intrinsic jitter allows the tester to address many of the inherent difficulties and subsequent inaccuracies of accurate jitter analysis.

The phase analysis method specified in ITU-T Draft O.172 (2003.11) was proposed by Anritsu. All MP1590A products with the MP1590A-30 option are calibrated using this method. It uses a digital sampling oscilloscope to analyze the jitter of devices under test (DUTs). The solution verifies pattern-dependent jitter by measuring the phase difference between the data falling/rising edges and the reference clock. Random jitter of the oscilloscope's trigger circuits is excluded by averaging many traces. An advanced DSP method is applied to the data to take account of the filter bandwidth.

The MP1590A-30 jitter analysis option is priced at $20,000, while the MP1590A mainframe has a base price of $57,285 that includes optical testing to 2.5 Gbps and electrical testing to 10 Gbps. Various configurations are available in four to six weeks.
Anritsu Company
(800) 267-4878
www.anritsu.com

LCR meter

Tegam has introduced the model 3550, a fully programmable 42.0 Hz to 5.00 MHz LCR meter. The 3550 is designed for a wide variety of automated or manual testing applications from traditional LCR measurements to frequency characterization of LCR components and materials.

This meter provides accurate and repeatable measurements of 16 parameters with a basic accuracy of 0.10 percent. Readings can be viewed on the three displays. Display A provides 4½-digit readings of inductance (L), capacitance (C), resistance (R), impedance (|Z|), or admittance (|Y|). Display B indicates 4½-digit measurement values for dissipation factor (D or Tan d), quality factor (Q), equivalent series resistance (Rs), equivalent parallel resistance (Rp), phase angle (q), conductance (G), reactance (X), or susceptance (B). Display C provides a four-digit reading of the output voltage (V), output current (I) or test frequency (F).

The three instrument measurement modes (voltage mode, constant voltage mode and constant current mode) allow the user to control the test signal independent of the DUT impedance. The user can select either absolute or percentage comparator operation and can enable an audible pass/fail buzzer.

A variety of accessories is available to accommodate various test applications. These include Kelvin Klips, Tweezers for Surface Mount Components, Surface Mount Test Fixtures, Radial/Axial Adapters and more.
Tegam
(440) 466-6100
www.tegam.com

USB 2.0 test package

Tektronix has introduced the TDSUSB2 USB2.0 physical layer test package that provides predefined oscilloscope setups for various tests. Users can perform all USB-IF recommended tests, such as eye diagram and parametric testing for low-speed, full-speed and high-speed devices and hubs. The comprehensive test fixture supports a wide range of tests. In-depth analysis is possible with the statistical information about the tests performed. The user-defined measurement limits also help to perform tolerance testing on a design.

TDSUSB2 comes on a CD and can be installed by the end-user. After installation, the application is accessible from File>Run Application in the menu bar of the TDS7000B series oscilloscopes.

In addition to the software, Tektronix offers a compliance test fixture that provides a probing solution for the signal quality test, inrush current check, drop and droop test, receiver sensitivity and impedance measurement test. Connectors are available for the DG2040 data generator and TDS8000B sampling oscilloscope with TDR module. The test fixture is a standard accessory with TDSUSB2.
Tektronix
(800) 833-9200
www.tektronix.com

Graphical development tool

National Instruments has announced LabVIEW 7.1, a significant upgrade to its family of LabVIEW graphical development products. LabVIEW 7.1 extends Express technology to automated instrumentation and real-time applications with new Express VIs for NI modular instruments and NI-DAQmx, advanced debugging and low-level execution timing for the LabVIEW 7.1 Real-Time Module.

With LabVIEW 7.1, NI continues to advance automated instrumentation for hardware platforms ranging from high-performance modular instruments to real-time data acquisition systems and handheld devices. With five new Express VIs for NI digitizers, signal generators and high-speed digital I/O, engineers can configure sophisticated measurements and acquire data with a few mouse clicks. The redesigned NI-DAQmx measurement services software in LabVIEW 7.1, available in real-time applications for the first time, increases performance of single-loop PID applications by 30 percent and simplifies hardware-timed loop implementation. In addition, the new LabVIEW 7.1 PDA module delivers more data acquisition functionality, including faster multichannel acquisition and analog and digital triggering. Engineers can use this module to create customized handheld DMM applications and communicate with Bluetooth-enabled devices.

LabVIEW 7.1 also introduces advanced execution timing and graphical debugging for low-level control and visibility of real-time system execution. With the new timed loop, an enhanced while loop in LabVIEW, engineers can specify precise timing of code segments, coordinate multiple time-critical activities and define priority-based loops for creating multirate applications. To further optimize performance of their applications, engineers can use the new LabVIEW Execution Trace Toolkit with the LabVIEW Real-Time Module to identify sources of jitter, such as memory allocation and race conditions.
National Instruments
(512) 683-5090
www.ni.com