Agilent Technologies and the Delft University of Technology in the Netherlands are collaborating on research into large-signal and sub-millimeter-wave characterization techniques. The new collaboration has created a tremendous acceleration in research activities and capabilities at the Delft Institute for Microsystems and Nanoelectronics (DIMES).

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Results include the creation of two complementary characterization facilities: the RF and the sub-millimeter-wave DIMES characterization laboratories. These new facilities will enable DIMES to continue to lead the technological advancement of devices, components, and circuits into the sub-millimeter-wave frequency range.

“Delft University’s leadership in RF characterization techniques for high-performance RF and wireless applications has already received international recognition,” said Roger Stancliff, chief technical officer, Components Test Division, Agilent Technologies. “DIMES’s expertise enriches our work, and we are able to give aspiring young scientists the opportunity to work with the latest equipment in RF/microwave from Agilent.”

The collaboration is enabled by the SmartMix/Memphis project. Memphis is a research initiative sponsored by the Dutch government via the SmartMix program, which supports innovators who work together. The goal of the Memphis project is research and development of an integrated technology platform (silicon logic, nanoelectronics, and photonics) to provide a broad range of multifunction miniaturized devices that combine electronics and photonics.

• Agilent Technologies
  www.agilent.com
• Delft University of Technology
  home.tudelft.nl/en/