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Samtec has introduced its new Spirit connectorless test probe (SCTP Series) to address the need for high-speed serial protocol testing with quick and reliable connection to electrically sensitive signals. The Spirit probe employs 100 W differential pair signal routing and patent-pending, replaceable, bifurcated compression contact array system on the DUT end with Samtec’s high-speed Q Strip connectors on the instrument end. This connectorless system provides for non-intrusive testing from 1.25 Gbps to 5.2 Gbps and is compatible with the Intel-specific PCI Express protocol footprint.

For increased reliability and longevity, the probe features a spring-loaded shroud to protect the compression contact tips from damage, while the replaceable contact array extends the life of the probe indefinitely.

It is available as components or in a complete kit with probe, replacement contact arrays, extraction tool, and probe fasteners. Application-specific logic to protocol analysis applications with differential pair counts and pinout maps are also available.

Pricing will vary based on connector size, cable length, and end options, said the manufacturer.