The Global Semiconductor Alliance (GSA) has announced the release of its Analog/Mixed-Signal/Radio Frequency (AMS/RF) Process Checklist Version 1.0. It is an aid for users of AMS/RF foundry services and provides standard definitions for quality and quantitative metrics. Developed by the GSA MS/RF Subcommittee’s Process Control Monitoring (PCM)/Process Checklist Working Group, the AMS/RF Process Checklist's metrics can be used for classification as well as for figures of merit in selecting the right semiconductor process for a specific design or application. Among the items covered by the checklist are process type, process attributes, active device attributes, and passive device attributes, and device libraries.

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According to David Schwan, engineering manager at RF Micro Devices and committee chairman for GSA’s PCM/Process Checklist Working Group, "The Process Checklist provides a quick and consistent overview of a mixed-signal process. Prior to the checklist’s availability, finding the equivalent information would often mean searching a number of documents. This checklist makes it easier for key decision makers to quickly determine whether a particular process has all of the required features." Targeted users of the checklist include semiconductor companies and contractors.

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