Agilent Technologies Inc. has introduced a parametric test solution for laboratory and R&D environments that provides ultra-short pulsed IV measurements as narrow as 10 nanoseconds. This capability makes possible  accurate testing of thermally or charge-sensitive devices such as silicon-on-insulator (SOI) and high-k dielectric transistors used in high-speed logic applications.

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It includes the B1500A semiconductor device analyzer, an Agilent pulse generator, an Agilent digital oscilloscope, new application software and pulsed IV accessories.

Until now, the pulsed IV measurement capability of R&D test systems has been limited to pulse widths insufficient to prevent harmful thermal effects in many modern semiconductor devices. Key benefits and differentiators of Agilent's solution include:
. support for ultra-short pulsed IV measurements down to true-square, 10-nanosecond pulse widths with two-nanosecond rise and fall times;
. 1-microamp current resolution for correlation between dc and pulse measurements;
. support for switching between standard dc characterization and pulsed IV characterization without having to change cables; and
. a flexible configuration that allows customers to use existing equipment, making initial cost of entry low.

Agilent's pulsed IV solution is available for purchase today, with shipments anticipated in the third quarter. Pricing for the ultra-short pulsed IV package, (software and pulsed IV accessories only), starts at $12,000. Pricing on other configurations varies depending upon the number of components required, such as oscilloscope, pulse generator, software and accessories, and whether or not the customer requires dc-to-pulsed IV switching capabilities. More information can be found at www.agilent.com/see/B1500A.