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SiTime Targets AI with Integrated Clock Chip for Data Centers

Ubiquitous Ethernet and Its Many Protocols

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Learning Resources

Design Tools and Resources Help Maintain Your Analog Edge

3D Printing, Unique Conductive Coating Yield Far Lighter RF Waveguide

Featured

The Rise of RISC-V and ISO 26262 Compliance

Can RISC-V meet ISO 26262 standards and reshape the automotive industry when it comes to functional safety? The latest trends suggest it’s already happening.

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Ideas for Design Vol. 3, No. 10 (Download)

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Editor's Choice

Quick Poll: Remembering MS-DOS

Advances in IoT Security: Enhanced Crypto Standards and High-Power Processing

Machine Learning

Quick Poll: How Are You Using Generative AI and LLMs?

What Actually is a Hot Loop?

SEARCH FOR DATA SHEETS, PRICE, STOCK, AND PART STATUS OF ELECTRONIC COMPONENTS

Industry Insights

The Future of Smart Healthcare Encompasses Bluetooth, RFID, and NFC

Machine Learning

Speculations on AI, Co-Evolution, and the Future of Our Species

More Product Highlights from embedded world 2024

Tesla Robotaxi Arriving in August, But Plans Dropped for Low-Cost EV

Bridging the Gap from IIoT Promise to IIoT Reality

Technology Advancements

3 Ways Silicon Carbide Paves the Path for Next-Gen EVs

Get Your Copy of MS-DOS

Redefining SmartNICs: The Composable Advantage

Voltage-Regulator ICs Close the Power Gap with Next-Gen Chips

Increasing EV Powertrain Efficiency Without Rare-Earth Materials

Top Strategies to Improve Microcontroller Security (Part 2)

“Drinking Bird” Becomes Triboelectric Energy Harvester

NACS/SAE J3400 EV Charging Interface: Protocols and the Transition (Part 2)

Products and Solutions

Test & Measurement

6 Ways Innovation is Changing Calibration

Application-Centric IIoT Gateway Enables Quick Solution Deployment

Application-Centric IIoT Gateway Speeds Solution Deployment

Gesture-Based Video Game Showcases Advanced MCU Performance

Adaptive SoC Delivers Single-Chip Automotive Solution

Analog

Solar Constant Lighting System Uses PV-Pushback-Effect

Voltage-Reference IC with Integral Heater Offers Single PPM-Class Results

Enhance ToF Mass Spectrometry with Low-Noise, High-Speed ADCs

Embedded

Packing CXL-Attached Memory into a PCIe Card

UMI Scales the Memory Wall in the Chiplet/Multi-Die Era

AMD’s New Family of Low-Cost FPGAs is All About Flexibility

Automation

The Robotics Revolution in Retail

Modular Industrial Raspberry Pi Delivers Flexible Customization

Machine Learning

Edge AI Unlocks a Safer World with Smarter Video Cameras

Test & Measurement

Rotary Encoder Wheels Perform Linear Position and Speed Sensing

Power

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Learning Resources

Mid-Voltage Systems Turn to GaN Devices to Achieve the Highest Power Density

Apply Power-Density Fundamentals to Enhance Power-Management Systems

Test & Measurement

Benefits from Calibrating Your Battery Tester

Lesser-Known High-Voltage Methods: From X-rays to Offshore Wind Farms

Bidirectional Current-Sense Amp Boosts Accuracy in Automotive Apps

Dual-Phase Voltage Regulator Brings the Power to Big AI Chips

Communications

Inside Intel’s Gaudi 3 Chip for AI Training and Inference

Quadrifilar Helix Antenna: Simplifying Remote Communications

Electronic Design’s BBS Restarts After 30 Years During Catastrophic Website Outage

Design the Heat Out of 3D Chip Technology

Test & Measurement

NVIDIA’s Omniverse Cloud APIs Redefine Digital-Twin Applications

Does This Chip Hold the Future of the Semiconductor Industry?

Test & Measurement

Dev Kit Simplifies Automotive Dynamic RGB-LED App Development

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Learning Resources

Accurate, Reliable High-Voltage Sensing is Critical to the Future of Electrification

How to Build Wide-Dynamic-Range Systems (Part 2)

Test & Measurement

The Essentials for Quality TDECQ Measurements