Modules Perform Stimulus/Analysis Testing For DigRF V4

Oct 3, 2008 9:56 AM, MD&D News Staff

The RDX (Radio Digital Cross-Domain) tester from Agilent Technologies Inc. enables comprehensive stimulus and analysis for Digital Radio Frequency (DigRF) V4 testing of RF and baseband ICs. DigRF V4, driven by the MIPI (Mobile Industry Processor Interface) Alliance, is a high-speed digital serial bus between mobile baseband and RF chips that is a key enabling technology for Long-Term Evolution (LTE) and WiMAX.

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The RDX tester consists of two modules, the Agilent N5343A exerciser module and the N5344A analysis module, which are housed in small, modular Agilent N2X mainframes. The modular structure is built to accommodate future multiple input/multiple output (MIMO) designs.

The Agilent E5345A and E5346A active probing solutions with ultra-low capacitive loading (less than 0.15 pF) and high sensitivity ensure minimum disturbance at the gigabit speeds used in DigRF V4 testing. Design engineers can choose between Agilent’s new N5345A Midbus Probe with Soft Touch technology for fast probing on prototype boards and the B5346A flying leads probing solutions, which simplify the monitoring of DigRF V4 links in space-constrained designs.

The RDX solution supports the DigRF V3 specification also. Test software included with the modules allows protocol generation and analysis and interoperates with Agilent’s Signal Studio software and 89600 vector signal analysis software.